surface electron microscope

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• Electron microscope — Diagram of a transmission electron microscope A 197 …   Wikipedia

• Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs …   Wikipedia

• scanning electron microscope — noun An electron microscope whose image is made up of a matrix of points from scanning the surface of a sample. See Also: electron microscope, scanning electron microscopy, transmission electron microscope …   Wiktionary

• scanning electron microscope — (SEM) An electron microscope that scans a beam of electrons over the surface of a specimen and forms an image of the surface from the electrons that are emitted by it …   Dictionary of microbiology

• scanning electron microscope — noun an electron microscope in which the surface of a specimen is scanned by a beam of electrons that are reflected to form an image …   English new terms dictionary

• Environmental scanning electron microscope — Wool fibers imaged in an ESEM by the use of two symmetrical plastic scintillating backscattered electron detectors …   Wikipedia

• scanning electron microscope — (SEM) A microscope with an electron beam that scans the specimen producing an image of the surface on a florescent screen …   Dictionary of invertebrate zoology

• scanning electron microscope — Abbreviation: SEM An electron beam based microscope used to examine, in a three dimensional screen image, the surface structure of prepared specimens …   Glossary of Biotechnology

• scanning electron microscope — (SEM)    Used to study surface morphology. The images produced are striking and often give the illusion of being three dimensional …   Forensic science glossary

• Electron beam lithography — (often abbreviated as e beam lithography) is the practice of scanning a beam of electrons in a patterned fashion across a surface covered with a film (called the resist),cite book |last= McCord |first=M. A. |coauthors=M. J. Rooks |title=… …   Wikipedia

• Electron beam induced current — (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority… …   Wikipedia